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Advanced Packaging / Wire Bond

Wire Bonding That Passes Screening.

Semiconductor wire bonding — gold ball, aluminum wedge, and ribbon interconnect, from fine-pitch die-to-substrate to heavy aluminum power loops. Bond programs developed with pull and shear verification, qualified to the standards your hardware ships under. Also written wirebond or wirebonding — same solid-state weld, same lab.

/ Au ball · Al wedge · ribbon / fluxless / MIL-STD when required / US-soil

Gold wire bonds connecting a die to a substrate at high magnification

Proof, from real builds

Au·Al

Gold and aluminum wire — ball, wedge & ribbon bond

Die→PCB

Lead-frame, substrate, PCB, die-to-die

2″–12″

Wafer formats handled · die-to-substrate, PCB & lead-frame

Pull/shear distributions, bond schedules, and qualification data available under NDA.

Types of wire bonding

Ball, wedge, and everything between.

One bonding cell, both metallurgies. We match the bond — gold thermosonic ball or aluminum ultrasonic wedge — to the pad, the pitch, the current, and the reliability target, not to whatever the shop happens to run.

Fine-pitch signal routing and heavy-wire power loops come off the same engineering team that develops the program and signs off the data.

  • 01Gold ball bonding — thermosonic, fine-pitch signal interconnect for die-to-substrate and die-to-die.
  • 02Aluminum wedge bonding — ultrasonic, low-temperature for Al-pad and temperature-sensitive devices, through to heavy aluminum wire for high-current power loops.
  • 03Ribbon bonding — low-inductance flat-ribbon interconnect as an alternative to round wire; ribbon sizes on request.
  • 04Fine-pitch routing — 15–50µm gold and aluminum wire, fine-pitch bonding on the ASM AERO Eagle platform where loop control and placement decide the yield.
  • 05Fluxless interconnect — clean assembly with no post-attach residue to remove.
  • 06Substrate flexibility — die to substrate, PCB, lead-frame, AlN, and ceramic carriers.

Au + Al wire 15–50µm · ball, wedge & ribbon · signal to power · 2″–12″ wafers · die-to-substrate / PCB / lead-frame.

How the weld is made

Three ways to weld a wire.

Wire bonding is a solid-state weld made from some mix of heat, force, and ultrasonic energy. The mix defines the method, and the method sets what pad metal, wire, and temperature budget a device can take. This is the general engineering picture; how Heisler dials each one in per device is in the process-control section below.

Thermocompression

Heat plus force, no ultrasonic. The classic gold ball bond, but it needs a hot substrate — often 300°C and up — to form the weld. That thermal budget rules out temperature-sensitive die, which is why pure thermocompression is now rare.

Ultrasonic

Force plus ultrasonic scrubbing at room temperature, no substrate heat. The standard route for aluminum wedge bonding and heavy-wire power loops, and the friendly option for die that cannot see a hot stage.

Thermosonic

Heat, force, and ultrasonic together. Moderate stage heat — well below thermocompression — plus ultrasonic energy makes a reliable gold ball bond at a temperature the die survives. It is the workhorse for fine-pitch gold today.

Gold or aluminum

Two wire metals, two jobs.

Gold wire
  • Noble metal, no surface oxide, so it ball-bonds cleanly by thermosonic.
  • Holds fine pitch and forms round, formable loops with strong, repeatable shapes.
  • On aluminum pads it grows gold-aluminum intermetallics, so the thermal budget has to be bounded (see failure modes below).
Aluminum wire
  • Ultrasonic wedge at room temperature, no stage heat needed.
  • Matches aluminum bond pads metal-to-metal, avoiding the gold-aluminum couple.
  • Scales to heavy wire for high-current power loops that fine gold cannot carry.

Heisler runs gold thermosonic, aluminum ultrasonic, and ribbon bonding in one cell, and picks per pad metal, pitch, current, and reliability target — advanced packaging engineering owns that call.

Gold wedge bonds die-to-substrate, 100um scale

Process control

A bond is data, not a guess.

Program development

Force, ultrasonic energy, time, and temperature dialed in per device — then locked as a documented schedule.

Loop control

Loop height and profile managed for clearance, span, and reliability — no shorts, no strain at the heel.

Pull & shear

Destructive pull testing to MIL-STD-883 Method 2011 and ball-bond shear testing to MIL-STD-883 Method 2037, with failure-mode capture, not just a pass count — production wire bonds typically run 3–4× the standard minimum pull strength.

DOE-driven

New devices run through structured DOE so the process window is found by data, not by re-bonding until it sticks. See how we develop →

Every adjustment stays traceable and tied to the pull/shear distribution it produced.

Bar chart of 44 wire-bond pull-strength measurements, all well above the MIL-STD-883 Method 2011 minimum (mean 3.9× the minimum, weakest bond 2.6×)

Representative wire-bond pull-test batch (n=44) against the MIL-STD-883 Method 2011 minimum.

Wire-pull test loops
Array of fine gold wire-bond loops on a packaged die — Heisler Semiconductor

Reliability by design

The failure modes we design out.

A wire bond fails in known ways. We keep those mechanisms out of the process window when we develop the schedule, then screen to prove they stayed out.

Gold-aluminum intermetallics

Where gold meets aluminum, intermetallic phases grow by diffusion, including the brittle AuAl2 known as "purple plague," and Kirkendall voiding can hollow the interface. Growth is driven by temperature and time, so we bound the thermal budget in bonding and cure, match wire to pad metallurgy, and run thermal-cycle stress to expose any intermetallic weakness before your hardware ships, not after.

Cratering

Too much ultrasonic energy or bond force fractures the silicon under the pad, a crater, worst at the bond perimeter, that a pull test alone can miss. The developed schedule bounds force and energy to seat the bond without cracking the die. Compound semiconductors like GaAs fracture at roughly half the strength of silicon, so the window is set tighter and verified on the actual substrate.

Heel cracking, intermetallics, and cratering are screened for on the same data package that ships with your build.

Qualification & reliability

Built to survive the screen.

A bond that looks good and a bond that survives 1,000 thermal cycles are different bonds. We develop to the second one. Screening and environmental stress are part of the build, not an afterthought handed to someone else.

MIL-STD screening

Wire-bond pull and shear per MIL-STD-883; visual and mechanical screening to program requirements.

Thermal cycling

Temperature-cycle stress to expose heel cracking and intermetallic weakness before flight, not after.

Hermetic & environmental

Bonding compatible with hermetic packaging and environmental qualification flows.

Traceable data

Per-lot bond data and screening results documented for your qualification package.

Full screening flows and reliability data → Failure analysis & reliability

Choosing the interconnect

Wire bond or flip chip?

Both run under one roof, so the recommendation is honest. Here is when wire bond is the right call — and when it isn't.

Choose wire bond
  • Lower volumes, fast turns, and design changes still in motion.
  • Peripheral I/O counts where re-routing to an array adds no value.
  • High-current power loops that want heavy aluminum wire.
  • Mature, well-understood reliability with broad MIL-STD precedent.
Consider flip chip
  • High I/O counts that need area-array, not a perimeter ring.
  • RF and mmWave paths where loop inductance hurts the signal.
  • Tight z-height budgets and dense multi-chip integration.
  • See flip-chip capability →

Not sure which fits your device? That is a design-review conversation — part of our advanced packaging engagement.

Where these bonds ship.

Aerospace & Defense

MIL-STD-qualified interconnect for flight and mission hardware. A&D packaging →

RF & mmWave

Short, controlled loops where bond geometry is part of the electrical design. RF & mmWave packaging →

Medical & Bio

Clean, fluxless assembly for sensitive sensor and instrument devices.

Advanced Sensors

Fine-pitch die-to-substrate routing for MEMS and detector packages.

How we engage

From your pads to qualified hardware.

One US-based engineering team owns the bond program — from die bonding through first article to screened delivery.

01   Pad metallurgy, pitch & reliability target review
02   Bond-program development & loop design
03   First-article pull/shear & failure-mode check
04   DOE refinement to a stable process window
05   Screening & environmental qualification
06   Documented schedule, data package & build

Wire bonding, answered.

What are the types of wire bonding?

Three types. Thermosonic gold (Au) ball bonding for fine-pitch signal interconnect; ultrasonic aluminum (Al) wedge bonding for aluminum-pad and temperature-sensitive devices and heavy-wire power loops; and ribbon bonding for low-inductance flat-ribbon interconnect, with ribbon sizes on request. Fine wire runs 15–50µm in gold and aluminum, with fine-pitch bonding on the ASM AERO Eagle platform. Heisler runs all three and selects per pad, pitch, current, and reliability target.

What is the difference between ball bonding and wedge bonding?

Gold ball bonding is thermosonic and suits fine-pitch signal interconnect on gold-finished pads. Aluminum wedge bonding is ultrasonic and runs at low temperature — a good fit for aluminum-pad and temperature-sensitive devices, and for heavy-wire power loops.

How do you verify wire bond quality?

Wire bonds are pull-tested to MIL-STD-883 Method 2011, the standard wire-bond pull test, alongside ball-bond shear testing to MIL-STD-883 Method 2037 — and production typically runs 3–4× the standard minimum pull strength. We capture the full pull and shear distribution and the failure modes, not just a pass count, so the process window is proven by data.

Can you qualify wire bonds to MIL-STD requirements?

Yes. We screen with pull and shear per MIL-STD-883, add thermal-cycle stress to expose heel cracking and intermetallic weakness, and support hermetic and environmental qualification flows with documented per-lot data.

When should I choose wire bond instead of flip chip?

Wire bond fits lower volumes, fast turns, designs still changing, peripheral I/O, high-current power loops, and mature MIL-STD reliability precedent. Flip chip fits high area-array I/O, RF and mmWave paths sensitive to loop inductance, and tight z-height integration. We run both, so the recommendation is based on the device, not the tool.

What substrates and wafer sizes do you support for wire bonding?

Die to substrate, PCB, lead-frame, AlN, and ceramic carriers, across wafer formats from 2 inch to 12 inch.

How do you prevent wire bond failures like purple plague and cratering?

Gold-aluminum intermetallic growth, including brittle AuAl2 ("purple plague") and Kirkendall voiding, is diffusion-driven, so we bound the thermal budget in bonding and cure and screen with thermal cycling to expose it before ship. Cratering, where excess ultrasonic energy or force fractures the die under the pad, is controlled by bounding force and energy in the developed schedule; the window is set tighter for GaAs and other compound semiconductors that fracture more readily than silicon.

What is thermosonic wire bonding?

Thermosonic bonding forms a gold ball bond from three ingredients at once: moderate stage heat, bond force, and ultrasonic energy. Because the ultrasonic scrubbing does part of the work, the weld forms at a far lower temperature than pure thermocompression — low enough for real die to survive. It is the standard method for fine-pitch gold ball bonding, and the one Heisler runs for gold interconnect.

Aluminum wire or gold wire — which should I use?

Gold ball-bonds cleanly by thermosonic, holds fine pitch, and forms round, formable loops, but it grows gold-aluminum intermetallics on aluminum pads and carries less current. Aluminum wedge-bonds ultrasonically at room temperature with no stage heat, matches aluminum pads metal-to-metal, and scales to heavy wire for high-current power loops. The right choice follows pad metal, pitch, current, and temperature budget — Heisler runs both and selects per device, not per available tool.

What wire diameters do you bond?

Fine wire from 15–50µm in both gold and aluminum for signal and fine-pitch interconnect, plus heavy aluminum wire for high-current power loops and ribbon interconnect with ribbon sizes on request. Fine-pitch bonding runs on the ASM AERO Eagle platform.

Watch / Wire bonding in 100 seconds

What is wire bonding?

The 100-second intro: how fine gold and aluminum wires connect a die to its package, ball vs wedge bonding, and how every bond is pull- and shear-tested to MIL-STD-883 in-house.

Watch on YouTube → What is wire bonding? · Get a wire bond quote →

Watch / Wire bond types

Ball vs wedge, gold vs aluminum.

A two-minute explainer on the two questions behind every wire bond — how the weld is made (ball or wedge) and what the wire is made of (gold or aluminum) — plus the three welds and how pad metal, pitch, and current pick one.

Watch on YouTube → Wire bond types explained · Get a wire bond quote →

Process More.

Send us the pad map.
We’ll send back bonds that screen clean.

Request a capability brief for bond schedules, pull/shear distributions, and qualification data under NDA.

Request a Capability Brief

/ US-soil / traceable / MIL-STD